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Details:
ID:65
Titel: Schaefer Technologie GmbH
Beschreibung:scanning Probe Microscopy, scanning Tunneling Microscopy, atomic Force Microscopy, optical Profilometers, interference Microscopy, MEMS Characterisation, nano-and Micro Testers, nanoparticle Analysis
Kategorie:Analytics
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Datum:April 08, 2007 12:20:04 PM
Anzahl Hits:4
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