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Details:
ID:136
Titel: Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung Universität Hamburg
Beschreibung:scanning probe methods (SPM),scanning tunneling microscopy (STM), atomic force microscopy (AFM), magnetic force microscopy (MFM) and other scanning probe methods (SXM)
Kategorie:Nanotechnology Institutions
Link Inhaber:
Datum:April 12, 2007 07:09:29 AM
Anzahl Hits:13
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